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High Speed Tester Product List

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High-Speed OPEN/LEAK Tester "R-5940"

High-Speed OPEN/LEAK Tester "R-5940"

IC multi-function inspection support! Equipped with an LCR meter developed in-house.

The R-5940 is a super tester specialized for IC embedded substrates. It meets the diverse needs of high-precision IC testing with high-speed continuity and short-circuit measurements, μΩ accuracy, high-speed testing with four-terminal measurements, and all-CH LCR measurements. By connecting up to 16 SMUs as power supplies and electronic loads to the DUT, it enables the implementation of power ON/OFF sequences, allowing for DUT measurements with freely combined SMUs. 【Features】 ■ High-speed testing ■ High precision ■ Specialized for IC embedded *For more details, please download the PDF or feel free to contact us.

  • Tester
  • High Speed Tester

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Semiconductor tester for high-speed testing of MLCCs and IPDs.

Semiconductor tester for high-speed testing of MLCCs and IPDs.

Expansion of measurement conditions and built-in 64 LCR meters enable faster and more accurate inspections!

Our "R-5920MK2" and "R-5940A" are multi-pin high-speed testers that achieve overwhelming efficiency and speed in the inspection of electronic components such as MLCCs (Multi-Layer Ceramic Capacitors) and IPDs (Integrated Passive Devices). We offer two new models tailored to our customers' inspection needs. 【R5920MK2】 ■ 4W inspection speed increase: Added "designated point output pull-in function" to the scanning unit for reliable judgment in bulk. ■ Improved contamination cleaning function: Cleaning current can be freely modulated and controlled from 100mA to 200mA. ■ Simultaneous parallel inspection with 64 LCR meters: LCR meters are directly built into the scanner card itself. ■ Significant increase in measurement speed: Achieved faster capacitance measurement speed compared to conventional testers. ■ Supports measurement of direct current consumption: Capable of controlling MEMS microphone ICs, allowing for measurement of power consumption.

  • Tester
  • Semiconductor inspection/test equipment
  • Circuit Board Inspection Equipment
  • High Speed Tester

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